F16S Metrology Application Engineer
Core
Develop, analyze, and implement metrology measurement techniques (lithography overlay, CD-SEM, ellipsometry, scatterometry, XRF, surface profiling) to support semiconductor manufacturing processes and equipment.
Role type
Senior IC metrology application engineer
Builds
Metrology applications and measurement capabilities for semiconductor fabs
Domain
Semiconductor manufacturing / Metrology
Required skills
Lithography overlay analysis, CD-SEM operation, ellipsometry, scatterometry, XRF, surface profiling, process optimization, supplier tool CIP management, NPI transfer support, data-driven problem solving
Preferred skills
AI-enabled workflow integration, automation, digital fluency
Technologies
CD-SEM, Ellipsometry, Scatterometry, XRF, SWR systems
Responsibilities
Develop and implement metrology techniques for lithography overlay and CD-SEM; Perform SWR lots for new process/equipment setup and optimization; Drive supplier tool CIP and NPI transfer activities; Engage in fab operations to improve quality, reduce cost/cycle time, and increase yield; Standardize knowledge and working methods for the metrology team.
Seniority
Senior, hands-on IC